Last edited by Voodooktilar
Thursday, May 14, 2020 | History

4 edition of Selected papers on speckle metrology found in the catalog.

Selected papers on speckle metrology

Selected papers on speckle metrology

  • 147 Want to read
  • 19 Currently reading

Published by SPIE Optical Engineering Press in Bellingham, Wash., USA .
Written in English

    Subjects:
  • Speckle metrology.,
  • Holographic interferometry.

  • Edition Notes

    Other titlesSpeckle metrology.
    StatementRajpal S. Sirohi, editor.
    SeriesSPIE milestone series ;, v. MS 35
    ContributionsSirohi, R. S., Society of Photo-optical Instrumentation Engineers.
    Classifications
    LC ClassificationsTA1555 .S45 1991
    The Physical Object
    Paginationxviii, 668 p. :
    Number of Pages668
    ID Numbers
    Open LibraryOL1539318M
    ISBN 100819406384, 0819406392
    LC Control Number91017832

    This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the. Selected papers on particle image velocimetry. Bellingham, Wash.: SPIE Optical Engineering Press, © (OCoLC) Document Type: Book: All Authors / Contributors: Ian Grant; Society of Photo-optical Instrumentation Engineers.

    Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with. The field of speckle metrology has seen a surge in development in the past 10 years owing to advancements in digital cameras and computing power. For instance, a variety of digital speckle correlation (DSC) processes can now be performed in almost real time and therefore speckle techniques has found applications in nondestructive testing (NDT.

    Search result for r-s-sirohi: Holography And Speckle Phenomena And Their Industrial Applications - Proceedings Of The International Workshop(), Speckle Metrology(), Machinery and Power Selection Models for Paddy Wheat Farms(), A Course of Experiments with Helium/Neon Laser(), Selected Papers on Speckle Metrology. Optical temperature sensor using speckle field. R.S. SirohiSelected papers on speckle metrology. SPIE Milestone Series, SPIE, Bellingham () Google Scholar He also authored 6 books and 3 books as an editor. He also has written 27 book chapters and 4 papers in SPIE Milestone series. He has also received several prizes and awards for.


Share this book
You might also like
Behring Sea arbitration. Argument of Her Majestyʹs government.

Behring Sea arbitration. Argument of Her Majestyʹs government.

Sierra Leone

Sierra Leone

Nevv Englands trials

Nevv Englands trials

Jim Dine

Jim Dine

Background notes, Latvia

Background notes, Latvia

Muzee, monumente și turism la Dunărea de Jos =

Muzee, monumente și turism la Dunărea de Jos =

Georg Lukács

Georg Lukács

Greece

Greece

The Bioarchaeology of Tuberculosis

The Bioarchaeology of Tuberculosis

Moorish Spain

Moorish Spain

intellectual milieu of John Dryden

intellectual milieu of John Dryden

Anjuna

Anjuna

Selected papers on speckle metrology Download PDF EPUB FB2

Spie Press Book Selected Papers on Speckle Metrology. Editor(s): Rajpal S. Sirohi. Format Member Price Non-Member Price; Softcover: $ $ Add to cart. Book Details. Date Published: 1 August Pages: ISBN: Volume: MS35 Table of Contents SHOW Table.

Selected Papers on Speckle Metrology by Sirohi,available at Book Depository with free delivery worldwide. Additional Physical Format: Online version: Selected papers on speckle metrology. Bellingham, Wash., USA: SPIE Optical Engineering Press, © Spie Press Book Selected Papers on Electronic Speckle Pattern Interferometry: Principles and Practice Editor(s): Peter Meinlschmidt ; Klaus D.

Hinsch ; Rajpal S. Sirohi. Spie Press Book Selected Papers on Interference, Interferometry, and Interferometric Metrology. Editor(s): Parameswaran Hariharan; Daniel Malacara-Hernandez.

Format (in Industrial Applications of Holographic and Speckle Measuring Techniques ). Speckle Metrology presents a diverse and wide collection of metrological speckle techniques and applications.

The book discusses both theoretical concepts and experimental methods in speckle-based measurements. Some chapters introduce speckle terminology and the physical characteristics of speckle. Other aspects also Selected papers on speckle metrology book in the book include. Application of long-range holography in earthquake engineering James D.

Trolinger, David C. Weber, Gerard C. Pardoen, Gudjon T. Gunnarsson, William F. Fagan (Optical Engineering ) Applications of holographic testing in nuclear technology A. Ettemeyer (Kerntechnik ) Investigations on Small Objects. Speckle Metrology presents a diverse and wide collection of metrological speckle techniques and applications.

The book discusses both theoretical concepts and experimental methods in speckle-based measurements. Some chapters introduce speckle terminology and the physical characteristics of speckle. Other aspects also covered in the book include methodology, system geometries, data.

Selected Papers on Optical Methods in Surface Metrology. Editor(s): David R. Whitehouse This item is not currently sold.

Book Details Measurement of surface roughness properties by using image speckle contrast Hitoshi Fujii, Toshimitsu Asakura, Yoshio Shindo (Journal of the Optical Society of America ). Speckle photography measures the positional changes of the speckles while speckle interferometry measures the phase changes, and consequently the irradiance changes.

It may be noted that both these changes occur simultaneously with one possibly predominating over the other. which is used with speckle metrology in this thesis can be found in the book “Light in Flight or The Holodiagram” by Nils Abramson [5].

Some important scientific papers about speckle metrology techniques are found in the SPIE Milestones series: Selected papers on Speckle metrology [6].

Some others are listed in the reference part. Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser.

(Book News, 1 August ) Professor Kaufmann has co-authored more than papers published in international journals and conference proceedings and several. J. Butters, J. Leendertz, Speckle pattern and holographic techniques in engineering metrology. Opt. Laser Technol. 3, 26–30 () CrossRef ADS Google Scholar.

Abstract. Because of their nonintrusive, real-time and full-field features, holographic interferometry [1, 2, 3, 4, 5, 6, 7, 8, 9, 10] and speckle metrology [11, Selected papers on phase-stepping method for fringe analysis Reid, G. T., Rixon, R.

and Messer, H. () Absolute and comparative shape measurement of three-dimensional shape by phase measuring moiré topography. Speckle Pattern Digital Holographic Electronic Speckle Pattern Interferometry Photorefractive Crystal Digital Hologram These keywords were added by machine and not by the authors.

This process is experimental and the keywords may be updated as the learning algorithm improves. While speckle has been a nuisance in almost all of the applications we have discussed previously, in the field of metrology, speckle is put to good use.

Applications that use speckle for measurements of displacements arose in the late s and early s, often. Speckle interferometry (SI) has become a complete technique, widely used in many branches of experimental mechanics.

Optical metrology is a field of physics, which includes theoretical and. The field of speckle metrology has seen a surge in development in the past 10 years owing to advancements in digital cameras and computing power. For instance, a variety of digital speckle correlation (DSC) processes can now be performed in almost real time and therefore speckle techniques has found applications in nondestructive testing (NDT.

This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the Reviews: 1.

Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light.

The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. Selected Papers on Speckle Metrology Sirohi, Rajpal S.Suja Helen Simson, Mahendra Prasad Kothiyal, Rajpal Singh Sirohi Proc.

SPIE.Two- and Three-Dimensional Methods for Inspection and Metrology IV KEYWORDS: Fringe analysis, Polarization, Interferometers, Polarizers, Wave plates, Phase interferometry, Optical interferometry, Jones calculus, Circular polarizers, Phase shifts.Speckle metrology [20] has been verified and deployed to measure the surface roughness of bulk metallic glasses through a laser-scattering method with adaptive optics, and can be integrated into a.